Courses on advanced topics IX - In-situ microscopy: key to fundamental understanding of material phenomena

ATTENTION!

The Course has been shifted a day - to 15 + 16 July. 

15–16/07/2021 10:00 – 11:30 (ONLINE)  

Suneel Kodambaka  

Department of Materials Science and Engineering,
University of California Los Angeles 

In situ microscopy enables direct visualization of surface morphological, compositional, and macro-, micro-, and nano-structural evolution of materials, and often reveals surprising and previously unknown aspects. In this lecture, I will give an overview of a few of the materials phenomena that can be studied using surface and bulk characterization techniques such as in situ variable-temperature scanning tunneling microscopy (VT-STM), low-energy electron microscopy (LEEM), scanning and transmission electron microscopies (SEM and TEM). Examples include: in situ STM and LEEM studies of two-dimensional graphene and hexagonal boron nitride (hBN) layer growth kinetics; in situ SEM and TEM studies of nanomechanical behavior of refractory transition-metal carbides.