Correlative Materials Characterisation

7/10/2021 - hybrid event  

The workshop was dedicated to the exciting field of Correlative Materials Characterization and Correlative Imaging. The aim is to bring together communities from Material and Life Science, discuss and explore common interests in this microscopy phenomenon. The subject is open to all relevant microscopy techniques used for correlative material characterization. The main focus will be on Electron microscopy, Atomic Force Microscopy, X-Ray microscopy, and light microscopy in various forms. 

Keynote Speakers:

Ehrenfried Zschech, deepXscan  – „Correlative Materials Characterization – Current Status and Perspectives“

Pavel Tomančák, MPI Dresden, CEITEC – „Combining dynamical and ultrastructural studies to gain biological insights”

Umberto Celano, University of Twente – „Correlative Scanning Probe Microscopy in Site-specific Analysis of Nanoelectronics“