Courses on Advanced Topics V - In-situ Electron Microscopy
18 November 2020
10:00 - 12:30
The course on in-situ scanning electron microscopy and in-situ transmission electron microscopy will be presented by Marc Willinger (ETH) and will cover the basics, capabilities and limitations, and practical examples of the techniques.
Modern analytical transmission electron microscopes are capable of delivering picometer resolved information about the geometric arrangement of atoms. However, conventional high-resolution observation in vacuum provides detailled information about an isolated material in vacuum. This is not sufficient if we are interested in processes such as material growth- and decomposition, corrosion or (electro)catalysis. Functional materials and catalysts should be studied in their relevant environment or under working conditions. In my presentation, I will speak about in-situ scanning and transmission electron microscopy. I will introduce the basics and demonstrate the capabilities and limitations using practical examples.